Gallagher Fluid Seals is a Parker Distributor is proud to be proud to be one of the few premier distributors to qualify as a “Parker Seal Technology Center (STC).”
Probably the most common cause of O-ring failure is compression set. An effective O-ring seal requires a continuous “seal line” between the sealed surfaces. The establishment of this “seal line” is a function of gland design and seal cross section which determines the correct amount of squeeze (compression) on the O-ring to maintain seal integrity without excessive deformation of the seal element.
Factors contributing to compression set failure of an O-ring seal:
1. Selection of material with inherently poor compression set properties.
2. Improper gland design.
3. Excessive temperature developed causing the O-ring to harden and lose its elastic
Gallagher recently published its Failure Modes of Elastomers in the Semiconductor Industry White Paper, now available for download on our site. This white paper discusses common issues that occur with elastomer seals in the semiconductor industry. The excerpt below is the fourth and final section of our new white paper, discussing Volatiles (offgassing) and Particle Generation. To download the white paper in its entirety, visit our Resources Page, or click on the image to the right.
High performance elastomers are found in many applications in the semiconductor industry (see paper titled Perfluoroelastomers in the Semiconductor Industry). Though perfluoroelastomer (FFKM) seals are formulated to meet the highest performance requirements of integrated circuit (chip) manufacturers, even these elastomers can’t solve every sealing application nor will they last forever in service. Additionally, end users need to understand subtle performance differences between perfluoroelastomers in the same product line. For example, one product may be better at minimizing particle generation while another may be better for high temperature services.
Gallagher recently published its Failure Modes of Elastomers in the Semiconductor Industry White Paper, now available for download on our site. This white paper discusses common issues that occur with elastomer seals in the semiconductor industry. The excerpt below is the third section of our new white paper, discussing O-Ring Stretch, Chemical Attack, Plasma Cracking, and Permeation. To download the entire white paper, visit our Resources Page, or click on the image to the right.
High performance elastomers are found in many applications in the semiconductor industry (see paper titled Perfluoroelastomers in the Semiconductor Industry). Though perfluoroelastomer (FFKM) seals are formulated to meet the highest performance requirements of integrated circuit (chip) manufacturers, even these elastomers can’t solve every sealing application nor will they last forever in service. Additionally, end users need to understand subtle performance differences between perfluoroelastomers in the same product line. For example, one product may be better at minimizing particle generation while another may be better for high temperature services.
Extrusion and nibbling of the O-ring is a primary cause of seal failure in dynamic applications such as hydraulic rod and piston seals. This form of failure may also be found from time to time in static applications subject to high pressure pulsing which causes the clearance gap of the mating flanges to open and close, trapping the O-ring between the mating surfaces.
Watch the video below from Parker's O-Ring eHandbook, showing how extrusion & nibbling can happen.
A few weeks ago on this blog, we discussed a few of the common reasons for O-Ring failure.
Typically, O-Rings fail due to adverse effects of a number of factors, from improper installation and lubrication to incorrect size and design.
Today we’ll continue that discussion by looking at three more reasons why O-Rings fail, along with ways to identify and correct these failures.
While O-Rings are an incredibly useful sealing application, they are not infallible. When they fail, it’s usually because of the combined adverse effects of several environmental factors.
The most common causes of O-Ring failures include:
The combination of stresses on the O-Ring can be complex and difficult to evaluate. Therefore, it is crucial that both the O-Ring compound and size be tested in the real environment of its service. Below you’ll find three examples of the types of O-Ring failure that can occur, what causes the failure and how to identify and correct it.